Michael Nagle (photographer)
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New York Fashion Week 2011

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NEW YORK --  FEBRUARY 10, 2011:  Tom Pecheux tests makeup on model Liu Wen during a test for Derek Lam during New York Fashion Week on February 10, 2011 in New York City.  (PHOTOGRAPH BY MICHAEL NAGLE)

NEW YORK -- FEBRUARY 10, 2011: Tom Pecheux tests makeup on model Liu Wen during a test for Derek Lam during New York Fashion Week on February 10, 2011 in New York City. (PHOTOGRAPH BY MICHAEL NAGLE)

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Copyright: © 2011 Michael Nagle